Description
The LTE/LTE-Advanced TDD measurement application is one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements and software. Transforming the X-Series signal analyzers into standard-based transmitter testers, the application provides RF conformance measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced TDD base station and user equipment devices. The measurement application closely follows the 3GPP standard allowing you to stay on the leading edge of your design and manufacturing challenges. For LTE-Advanced demodulation measurements, such as EVM and frequency error, the measurement application uses an automatic sequencing function, instead of a single wideband capture of the multi-carrier signal, eliminating the need for the wide analysis bandwidth option on the X-Series signal analyzer and thereby reducing the overall test equipment cost. RF transmitter testing Simplify measurement setup with automatic detection of downlink channels and signals. For eNB conformance testing, measurement is simplified by recalling E-TM presets, for each carrier, according to 3GPP TS 36.141 conformance document. Perform measurement on all LTE/LTE-Advanced channel bandwidths with ability to view measured res ults – of up to 5 CCs for LTE-Advanced- in multiple domains such as resource block, sub-carrier, slot, or symbol. Graphical displays with color coding and marker coupling allows you to search for problems faster and troubleshoot the found problems quicker. Test beyond physical layer by using the transport layer decoding functionality. Troubleshoot transport layer problems and verify the channel encoding is correct by getting access to data at different points in the receiver chain such as: demapped, deinterleaved, descrambled, deratematched and decoded data.
