Description
Use the DDR3 and LPDDR3 application to test, debug and characterize your DDR3 and LPDDR3 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report at the end of the test. The application not only compare the results with the specification test limit but also includes margin analysis which indicates how closely the device passes or fails each test. On top of that, the complex analysis of the DDR3 and LPDDR3 signals is taken care by the application which saves user time and effort if the measurements are done manually.
